{"id":104,"date":"2026-02-23T05:24:44","date_gmt":"2026-02-23T05:24:44","guid":{"rendered":"http:\/\/nextherm.co.kr\/eng\/?page_id=104"},"modified":"2026-02-27T08:02:18","modified_gmt":"2026-02-27T08:02:18","slug":"%ec%98%a8%eb%8f%84%ec%a0%9c%ec%96%b4-test-chiller","status":"publish","type":"page","link":"http:\/\/nextherm.co.kr\/eng\/%ec%98%a8%eb%8f%84%ec%a0%9c%ec%96%b4-test-chiller\/","title":{"rendered":"\uc628\ub3c4\uc81c\uc5b4 Test Chiller"},"content":{"rendered":"<p>[et_pb_section fb_built=&#8221;1&#8243; _builder_version=&#8221;4.27.4&#8243; _module_preset=&#8221;default&#8221; background_image=&#8221;http:\/\/nextherm.co.kr\/eng\/wp-content\/uploads\/sites\/2\/2026\/02\/sub-banner02-1.png&#8221; custom_padding=&#8221;8%||8%||true|false&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_row _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_column type=&#8221;4_4&#8243; _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_text _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|600|||||||&#8221; text_text_color=&#8221;#FFFFFF&#8221; text_font_size=&#8221;33px&#8221; text_orientation=&#8221;center&#8221; global_colors_info=&#8221;{}&#8221;]Business Areas[\/et_pb_text][\/et_pb_column][\/et_pb_row][\/et_pb_section][et_pb_section fb_built=&#8221;1&#8243; fullwidth=&#8221;on&#8221; _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_fullwidth_code _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; hover_enabled=&#8221;0&#8243; global_colors_info=&#8221;{}&#8221; sticky_enabled=&#8221;0&#8243;]<\/p>\n<nav class=\"lnb\"><!-- [et_pb_line_break_holder] --><\/p>\n<ul><!-- [et_pb_line_break_holder] -->  <\/p>\n<li><a class=\"on\" href=\"\/eng\/\uc628\ub3c4\uc81c\uc5b4-test-chiller\/\" id=\"sub06\">Semiconductor<\/a><\/li>\n<p><!-- [et_pb_line_break_holder] -->  <\/p>\n<li><a href=\"\/eng\/\uc804\uae30\uc790\ub3d9\ucc28-\uace0\uc18d\ucda9\uc804\uae30\uc6a9-chiller\/\" id=\"sub03\">Electric Vehicles<\/a><\/li>\n<p><!-- [et_pb_line_break_holder] -->  <\/p>\n<li><a href=\"\/eng\/\uc720\ud1b5-pump\/\" id=\"sub03\">Distribution<\/a><\/li>\n<p><!-- [et_pb_line_break_holder] --><\/ul>\n<p><!-- [et_pb_line_break_holder] --><\/nav>\n<p>[\/et_pb_fullwidth_code][\/et_pb_section][et_pb_section fb_built=&#8221;1&#8243; _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_row _builder_version=&#8221;4.27.4&#8243; _module_preset=&#8221;default&#8221; custom_margin=&#8221;||5%||false|false&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_column type=&#8221;4_4&#8243; _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_code _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; hover_enabled=&#8221;0&#8243; global_colors_info=&#8221;{}&#8221; sticky_enabled=&#8221;0&#8243;]<\/p>\n<nav class=\"lnbb\"><!-- [et_pb_line_break_holder] -->    <\/p>\n<ul><!-- [et_pb_line_break_holder] -->        <\/p>\n<li class=\"om\"><a href=\"\/eng\/\uc628\ub3c4\uc81c\uc5b4-test-chiller\/\" id=\"sub01\" >Test Chiller<\/a><\/li>\n<p><!-- [et_pb_line_break_holder] -->        <\/p>\n<li><a href=\"\/eng\/\uc628\ub3c4\uc81c\uc5b4-c-saver\/\" id=\"sub02\">C-Saver<\/a><\/li>\n<p><!-- [et_pb_line_break_holder] -->        <\/p>\n<li><a href=\"\/eng\/\uc628\ub3c4\uc81c\uc5b4-\uc7a5\ube44\/\" id=\"sub02\">Temperature Control Equipment <\/a><\/li>\n<p><!-- [et_pb_line_break_holder] -->    <\/ul>\n<p><!-- [et_pb_line_break_holder] --><\/nav>\n<p>[\/et_pb_code][\/et_pb_column][\/et_pb_row][et_pb_row _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_column type=&#8221;4_4&#8243; _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_text _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|600|||||||&#8221; text_text_color=&#8221;#000000&#8243; text_font_size=&#8221;30px&#8221; text_orientation=&#8221;center&#8221; global_colors_info=&#8221;{}&#8221;]Test Chiller<\/p>\n<div><span style=\"display: inline-block; width: 50px; border-bottom: 3px solid #5474b8;\"><\/span><\/div>\n<p>[\/et_pb_text][et_pb_text _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|300|||||||&#8221; text_text_color=&#8221;#000000&#8243; text_font_size=&#8221;17px&#8221; text_orientation=&#8221;center&#8221; text_font_size_tablet=&#8221;17px&#8221; text_font_size_phone=&#8221;15px&#8221; text_font_size_last_edited=&#8221;on|phone&#8221; global_colors_info=&#8221;{}&#8221;]Semiconductor test chillers are precision cooling systems used to control the heat generated by semiconductor test equipment such as wafer probers, burn-in systems, and test chambers. Because heat generated from chips during testing can significantly affect electrical characteristic measurements, test chillers precisely and rapidly control temperature to ensure data reliability and repeatability.[\/et_pb_text][et_pb_text _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|600|||||||&#8221; text_text_color=&#8221;#000000&#8243; text_font_size=&#8221;25px&#8221; custom_padding=&#8221;|||1%|false|false&#8221; border_width_left=&#8221;4px&#8221; border_color_left=&#8221;gcid-1d7932b8-13d0-40cf-897f-ddde0121e46f&#8221; global_colors_info=&#8221;{%22gcid-1d7932b8-13d0-40cf-897f-ddde0121e46f%22:%91%22border_color_left%22%93}&#8221;]Key Functions[\/et_pb_text][et_pb_text _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|300|||||||&#8221; text_text_color=&#8221;#000000&#8243; text_font_size=&#8221;17px&#8221; background_color=&#8221;#eeeeee&#8221; custom_padding=&#8221;2%|2%|2%|2%|true|true&#8221; custom_padding_tablet=&#8221;3%|3%|3%|3%|true|true&#8221; custom_padding_phone=&#8221;5%|5%|5%|5%|true|true&#8221; custom_padding_last_edited=&#8221;on|phone&#8221; text_font_size_tablet=&#8221;17px&#8221; text_font_size_phone=&#8221;15px&#8221; text_font_size_last_edited=&#8221;on|phone&#8221; global_colors_info=&#8221;{}&#8221;]- Temperature stabilization: Controls the temperature inside test equipment and the DUT (Device Under Test) to within \u00b10.5 \u00b0C<br \/>\n&#8211; Heat removal: Rapidly absorbs heat generated during chip operation to prevent thermal buildup<br \/>\n&#8211; Test reliability: Minimizes variations in electrical characteristics caused by temperature fluctuations<br \/>\n&#8211; Yield improvement: Prevents false failures caused by unnecessary thermal stress[\/et_pb_text][et_pb_text _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|600|||||||&#8221; text_text_color=&#8221;#000000&#8243; text_font_size=&#8221;25px&#8221; custom_padding=&#8221;|||1%|false|false&#8221; border_width_left=&#8221;4px&#8221; border_color_left=&#8221;gcid-1d7932b8-13d0-40cf-897f-ddde0121e46f&#8221; global_colors_info=&#8221;{%22gcid-1d7932b8-13d0-40cf-897f-ddde0121e46f%22:%91%22border_color_left%22%93}&#8221;]Applications[\/et_pb_text][et_pb_text _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|300|||||||&#8221; text_text_color=&#8221;#000000&#8243; text_font_size=&#8221;17px&#8221; background_color=&#8221;#eeeeee&#8221; custom_padding=&#8221;2%|2%|2%|2%|true|true&#8221; custom_padding_tablet=&#8221;3%|3%|3%|3%|true|true&#8221; custom_padding_phone=&#8221;5%|5%|5%|5%|true|true&#8221; custom_padding_last_edited=&#8221;on|phone&#8221; text_font_size_tablet=&#8221;17px&#8221; text_font_size_phone=&#8221;15px&#8221; text_font_size_last_edited=&#8221;on|phone&#8221; global_colors_info=&#8221;{}&#8221;]- Wafer prober testing (measurement of chip electrical characteristics)<br \/>\n&#8211; Package testing (temperature reliability testing of IC packages)<br \/>\n&#8211; Reliability evaluation (thermal cycling, burn-in testing)<br \/>\n&#8211; MEMS and sensor testing (environmental evaluation of temperature-sensitive devices)[\/et_pb_text][et_pb_divider color=&#8221;#cccccc&#8221; _builder_version=&#8221;4.27.4&#8243; _module_preset=&#8221;default&#8221; custom_margin=&#8221;10%||||false|false&#8221; global_colors_info=&#8221;{}&#8221;][\/et_pb_divider][\/et_pb_column][\/et_pb_row][et_pb_row _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_column type=&#8221;4_4&#8243; _builder_version=&#8221;4.27.0&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_text _builder_version=&#8221;4.27.4&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|600|||||||&#8221; text_text_color=&#8221;#000000&#8243; text_font_size=&#8221;30px&#8221; text_orientation=&#8221;center&#8221; global_colors_info=&#8221;{}&#8221;]PRODUCT<\/p>\n<div><span style=\"display: inline-block; width: 50px; border-bottom: 3px solid #5474b8;\"><\/span><\/div>\n<p>[\/et_pb_text][\/et_pb_column][\/et_pb_row][et_pb_row column_structure=&#8221;1_3,1_3,1_3&#8243; _builder_version=&#8221;4.27.4&#8243; _module_preset=&#8221;default&#8221; custom_margin=&#8221;||5%||false|false&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_column type=&#8221;1_3&#8243; _builder_version=&#8221;4.27.4&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][et_pb_text _builder_version=&#8221;4.27.5&#8243; _module_preset=&#8221;default&#8221; text_font=&#8221;|600|||||||&#8221; text_text_color=&#8221;#000000&#8243; text_font_size=&#8221;15px&#8221; text_orientation=&#8221;center&#8221; custom_padding=&#8221;2%|2%|2%|2%|true|true&#8221; link_option_url=&#8221;\/eng\/\ubc18\ub3c4\uccb4-\uc628\ub3c4\uc81c\uc5b4-wafer-probe-test-chiller\/&#8221; hover_enabled=&#8221;0&#8243; border_width_all=&#8221;1px&#8221; border_color_all=&#8221;gcid-dcdbde10-fc94-4f3a-8cbe-dec87451051f&#8221; global_colors_info=&#8221;{%22gcid-1d7932b8-13d0-40cf-897f-ddde0121e46f%22:%91%22border_color_all__hover%22%93,%22gcid-dcdbde10-fc94-4f3a-8cbe-dec87451051f%22:%91%22border_color_all%22%93}&#8221; border_color_all__hover_enabled=&#8221;on|desktop&#8221; border_color_all__hover=&#8221;#5474b8&#8243; sticky_enabled=&#8221;0&#8243;]<\/p>\n<div class=\"business-item\"><img decoding=\"async\" src=\"http:\/\/nextherm.co.kr\/eng\/wp-content\/uploads\/sites\/2\/2026\/02\/sub-img52.png\" \/><br \/><span>Wafer Probe Test Chiller<br \/><\/span><\/div>\n<p>[\/et_pb_text][\/et_pb_column][et_pb_column type=&#8221;1_3&#8243; _builder_version=&#8221;4.27.4&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][\/et_pb_column][et_pb_column type=&#8221;1_3&#8243; _builder_version=&#8221;4.27.4&#8243; _module_preset=&#8221;default&#8221; global_colors_info=&#8221;{}&#8221;][\/et_pb_column][\/et_pb_row][\/et_pb_section]<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Business AreasTest Chiller Semiconductor test chillers are precision cooling systems used to control the heat generated by semiconductor test equipment such as wafer probers, burn-in systems, and test chambers. Because heat generated from chips during testing can significantly affect electrical characteristic measurements, test chillers precisely and rapidly control temperature to ensure data reliability and repeatability.Key [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_et_pb_use_builder":"on","_et_pb_old_content":"","_et_gb_content_width":"","footnotes":""},"class_list":["post-104","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"http:\/\/nextherm.co.kr\/eng\/wp-json\/wp\/v2\/pages\/104","targetHints":{"allow":["GET"]}}],"collection":[{"href":"http:\/\/nextherm.co.kr\/eng\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"http:\/\/nextherm.co.kr\/eng\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"http:\/\/nextherm.co.kr\/eng\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"http:\/\/nextherm.co.kr\/eng\/wp-json\/wp\/v2\/comments?post=104"}],"version-history":[{"count":7,"href":"http:\/\/nextherm.co.kr\/eng\/wp-json\/wp\/v2\/pages\/104\/revisions"}],"predecessor-version":[{"id":239,"href":"http:\/\/nextherm.co.kr\/eng\/wp-json\/wp\/v2\/pages\/104\/revisions\/239"}],"wp:attachment":[{"href":"http:\/\/nextherm.co.kr\/eng\/wp-json\/wp\/v2\/media?parent=104"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}