Business Areas
Test Chiller
Semiconductor test chillers are precision cooling systems used to control the heat generated by semiconductor test equipment such as wafer probers, burn-in systems, and test chambers. Because heat generated from chips during testing can significantly affect electrical characteristic measurements, test chillers precisely and rapidly control temperature to ensure data reliability and repeatability.
Key Functions
– Temperature stabilization: Controls the temperature inside test equipment and the DUT (Device Under Test) to within ±0.5 °C
– Heat removal: Rapidly absorbs heat generated during chip operation to prevent thermal buildup
– Test reliability: Minimizes variations in electrical characteristics caused by temperature fluctuations
– Yield improvement: Prevents false failures caused by unnecessary thermal stress
– Heat removal: Rapidly absorbs heat generated during chip operation to prevent thermal buildup
– Test reliability: Minimizes variations in electrical characteristics caused by temperature fluctuations
– Yield improvement: Prevents false failures caused by unnecessary thermal stress
Applications
– Wafer prober testing (measurement of chip electrical characteristics)
– Package testing (temperature reliability testing of IC packages)
– Reliability evaluation (thermal cycling, burn-in testing)
– MEMS and sensor testing (environmental evaluation of temperature-sensitive devices)
– Package testing (temperature reliability testing of IC packages)
– Reliability evaluation (thermal cycling, burn-in testing)
– MEMS and sensor testing (environmental evaluation of temperature-sensitive devices)
PRODUCT
Wafer Probe Test Chiller